Free Webinar - Laser Testing Of Single Event Effects (SEE) and Case Studies with Dr. Rez Mani
12 October 2022 - 14.00 to 15.00 EST
Join us for this free webinar
The webinar introduces the Single Event effect (SEE) and discusses a few results which demonstrate this effect at the SEE laser test facility located at Allied Scientific Pro’s headquarters.
Space-born instruments carry many electronic devices including micro-processors, FPGAs, shift registers, analog devices, etc. If a charged or an uncharged particle from space strikes a sensitive node of an electronic circuit, it may cause a disruption or permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic devices prior to space launch for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for threshold energy and saturation cross section, the process is expensive and can be done only in localized test centers. The optical testing using near IR pulsed lasers of pico-second pulse-width and pico/nano-joule pulse energy is much easier to set up and can be done at any location. A Near-IR laser beam of a few micrometers diameter is focused on the device and can provide spatial and temporal information about the occurrence of the SEE which the radiation method is unable to provide. The webinar will introduce the Single Photon Absorption (SPA) test facility at Allied Scientific Pro and it will also discuss observation of SEE on a few digital and analog devices.
M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This followed by a PhD in Earth and Space Science focused on satellite optical instrumentation from York University in Toronto, Ontario. More than 20 years of experience in the field of Photonics and has worked for Allied Scientific Pro as an application Scientist since 2017.