Host: Rez Mani did an M.Eng in Engineering Physics focused on optical properties of semiconductors from McMaster University in Hamilton, Ontario. This was followed by a Ph.D. in Earth and Space Science focused on satellite optical instrumentation from York University in Toronto, Ontario. After working in the industry for 10 years, where he participated in a multitude of optical/laser/spectroscopic projects, he returned to York University as a contract faculty and a research associate in 2011. He has also worked for Allied Scientific Pro as a consultant since 2011 and as an application scientist since 2017.
The webinar introduces the Single Event effect (SEE) and discusses a few results which demonstrate this effect at the SEE laser test facility located at Allied Scientific Pro’s headquarters.
Space-born instruments carry many electronic devices including micro-processors, FPGAs, shift registers, analog devices, etc. If a charged or an uncharged particle from space, strikes a sensitive node of an electronic circuit, it may cause a disruption or a permanent damage. This effect is known as Single Event Effect (SEE). Testing of electronic devices prior to space launch for radiation hardness is crucial to protect them against this danger. Although testing in particle accelerator facilities produces absolute results for threshold energy and saturation cross section, the process is expensive and can be done only in localized test centers. The optical testing using near IR pulsed lasers of pico-second pulse-width and pico/nano-joule pulse energy is much easier to set up and can be done at any location. A Near-IR laser beam is focused by a microscope objective to a few micron diameter on the device and can provide spatial and temporal information about the occurrence of the SEE which the radiation method is unable to provide. The webinar will introduce the Single Photon Absorption (SPA) test facility at Allied Scientific Pro and it will also discuss observation of SEE in digital and analog devices.
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