Ricky Lebeau Understanding the Single Event Effect (SEE) Understanding the Single Event Effect (SEE) Space-born instruments carry many electronic devices including micro-processors, registers in digital circuits, etc. If a charged particle from space, strik... SEE Workstation Feb 18, 2025
Ricky Lebeau Impact of laser pulse duration to induce Single Event Upset (SEU) Impact of laser pulse duration to induce Single Event Upset (SEU) Pulsed lasers have proven to be a very economical and fast alternative to testing Single Event Effect as compared to radiation sources... SEE Workstation Feb 13, 2025
Aissam Saouli Complementary use of Two Photon Absorption (TPA) and Particle SEE Testing Complementary use of two photon absorption (TPA) and particle SEE testing SEE testing of microelectronic devices is complex and multiple methods may be needed to optimize the measurements and get an a... SEE Workstation Feb 5, 2025
Aissam Saouli Single Event Effect (SEE) in complex devices This article talks about SEE in complex devices. It mainly focuses on Single Event Burnout (SEB) in power MOSFETs and also touches on Single Event Upset (SEU) and Single Event Functional Interrupt (SE... SEE Workstation Jan 13, 2025
